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| DM74S00 Quad 2-Input NAND Gate August 1986 Revised May 2000 DM74S00 Quad 2-Input NAND Gate General Description This device contains four independent gates each of which performs the logic NAND function. Ordering Code: Order Number DM74S00M DM74S00N Package Number M14A N14A Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter "X" to the ordering code. Connection Diagram Function Table Y = AB Inputs A L L H H H = HIGH Logic Level L = LOW Logic Level Output B L H L H Y H H H L (c) 2000 Fairchild Semiconductor Corporation DS006489 www.fairchildsemi.com DM74S00 Absolute Maximum Ratings(Note 1) Supply Voltage Input Voltage Operating Free Air Temperature Range Storage Temperature Range 7V 5.5V 0C to +70C -65C to +150C Note 1: The "Absolute Maximum Ratings" are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The "Recommended Operating Conditions" table will define the conditions for actual device operation. Recommended Operating Conditions Symbol VCC VIH VIL IOH IOL TA Supply Voltage HIGH Level Input Voltage LOW Level Input Voltage HIGH Level Output Current LOW Level Output Current Free Air Operating Temperature 0 Parameter Min 4.75 2 0.8 -1 20 70 Nom 5 Max 5.25 Units V V V mA mA C Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted) Symbol VI VOH VOL II IIH IIL IOS ICCH ICCL Parameter Input Clamp Voltage HIGH Level Output Voltage LOW Level Output Voltage Input Current @ Max Input Voltage HIGH Level Input Current LOW Level Input Current Short Circuit Output Current Supply Current with Outputs HIGH Supply Current with Outputs LOW Conditions VCC = Min, II = -18 mA VCC = Min, IOH = Max VIL = Max VCC = Min, IOL = Max VIH = Min VCC = Max, VI = 5.5V VCC = Max, VI = 2.7V VCC = Max, VI = 0.5V VCC = Max (Note 3) VCC = Max VCC = Max -40 10 20 0.5 1 50 -2 -100 16 36 2.7 3.4 Min Typ (Note 2) Max -1.2 Units V V V mA A mA mA mA mA Switching Characteristics at VCC = 5V and TA = 25C (See Section 1 for Test Waveforms and Output Load) RL = 280 Symbol Parameter CL = 15 pF Min tPLH tPHL Propagation Delay Time LOW-to-HIGH Level Output Propagation Delay Time HIGH-to-LOW Level Output Note 2: All typicals are at VCC = 5V, TA = 25C. Note 3: Not more than one output should be shorted at a time and the duration should not exceed one second. CL = 50 pF Min 2 2 Max 7 8 Units Max 4.5 5 2 2 ns ns www.fairchildsemi.com 2 DM74S00 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A 3 www.fairchildsemi.com DM74S00 Quad 2-Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 4 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com |
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